New E-SEM enhances Failure Analysis capabilities

AMSTERDAM, THE NETHERLANDS - March 18, 2005

Stork FDO engineers in Amsterdam recently completed installation of a new top-of-the-line Environmental Scanning Electron Microscope (E-SEM). This advanced instrument significantly enhances the laboratory's failure analysis and microscopic examination capabilities.

The E-SEM's three imaging modes (high vacuum, low vacuum, and E-SEM) accommodate the widest range of samples of any SEM system. Non-conductive materials can be examined without special preparation and coating, as required with conventional electron microscopes. Even minerals and moist speciments, paper, concrete, or organic materials can be analyzed at extremely high resolutions and magnifications. The microscope is equipped with a roomy chamber to accommodate very large samples. The integrated Electron Dispersive X-Ray, or EDX, system allows for composition analysis with enhance capabilities for complete mappings to detect local differences. Analytical tools make it possible to do geometrical measurements at fractions of a micrometer or 3D profiling of the sample surface.